Imaging and analysis of 3-D structure using a dual beam FIB

Microscopy Research and Technique

Volumn 70, Issue 3, 2007, Pages 186-194

  McGrouther, D ^a   Munroe, P R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

3D microscopy; FIB cross sectioning; Materials science

Indexed keywords

3-D MICROSCOPY; DUAL-BEAM; FIB CROSS-SECTIONING; FOCUSED IONS BEAMS; MATERIAL SCIENCE; MICRO-STRUCTURAL;

ION BEAMS;

ANALYTIC METHOD; ARTICLE; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; INSTRUMENTATION; MATERIALS; MICRO-COMPUTED TOMOGRAPHY; MICROSCOPY; PRIORITY JOURNAL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X RAY;

EID: 33847732712     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20406     Document Type: Article

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