Evanescent fields - Direct measurement, modeling, and application

Microscopy Research and Technique

Volumn 70, Issue 3, 2007, Pages 181-185

  Huntington, S T ^a   Ladouceur, F ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Contact mode; Evanescent fields; Microscopy; SNOM; Tapping mode; Tip oscillation; Waveguide

Indexed keywords

EFFICIENCY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SILICA; WAVEGUIDES;

CONTACT MODES; DIRECT MEASUREMENT; EDGE-EFFECTS; FIELD DISTRIBUTION; MEASUREMENT MODEL; MODE SCANNING; PLANAR-WAVEGUIDE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; TAPPING MODES; TIP OSCILLATION;

EVANESCENT FIELDS;

SILICON DIOXIDE;

ACCURACY; AMPLITUDE MODULATION; ARTICLE; COMPARATIVE STUDY; MEASUREMENT; MODEL; OSCILLATION; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE PROPERTY; WAVEFORM;

EID: 33847704584     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20405     Document Type: Article

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