Scanning near-field optical microscope for the characterization of optical integrated waveguides

Journal of Lightwave Technology

Volumn 18, Issue 3, 2000, Pages 370-374

  Borrise X ^a   Jimenez D ^a   Barniol, N ^a   Perez Murano F ^a   Aymerich, X ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; INTEGRATED OPTICS; INTEGRATED OPTOELECTRONICS; LIGHT PROPAGATION; OPTICAL FIBERS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SCANNING;

EVANESCENT FIELD; OPTICAL FIELD DISTRIBUTION; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

OPTICAL WAVEGUIDES;

EID: 16744365446     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.827509     Document Type: Article

References (12)

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