Structural characterization and refractive index dispersion analysis of HgSe thin films grown by reactive solutions

Journal of Physics Condensed Matter

Volumn 19, Issue 11, 2007, Pages

  Girgis, S Y ^a   Salem, A M ^a   Selim, M S ^a  

^a NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; MERCURY COMPOUNDS; REACTION KINETICS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

DISPERSION THEORY; GLASS SUBSTRATES; REACTIVE SOLUTIONS;

THIN FILMS;

EID: 33847700866     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/11/116213     Document Type: Article

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