Preparation and characterization of chemically deposited PbSnS3 thin films

Materials Chemistry and Physics

Volumn 80, Issue 3, 2003, Pages 740-745

  Salem, A M ^a   Abou Helal, M O ^a  

^a NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

Electrical properties; Optical properties; PbSnS3; Structure; Thin films

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS MATERIALS; ANNEALING; CARRIER CONCENTRATION; CRYSTALLINE MATERIALS; DEPOSITION; ELECTRIC CONDUCTIVITY; LEAD COMPOUNDS; LIGHT ABSORPTION; PERMITTIVITY; PHASE TRANSITIONS; PHOTONS; REFRACTIVE INDEX; SOLUTIONS; STRUCTURAL ANALYSIS; X RAY DIFFRACTION ANALYSIS;

OPTICAL BAND GAPS;

THIN FILMS;

EID: 0037881904     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00081-6     Document Type: Article

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