Room temperature negative differential resistance of CdF 2/CaF2 double-barrier resonant tunneling diode structures grown on Si(100) substrates

Applied Physics Letters

Volumn 90, Issue 9, 2007, Pages

  Kanazawa, Tohru ^a   Fujii, Ryo ^a   Wada, Takafumi ^a   Suzuki, Yusuke ^a   Watanabe, Masahiro ^a,b   Asada, Masahiro ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

RESONANT TUNNELING; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SUBSTRATES; THERMAL EFFECTS;

DIODE STRUCTURES; NEGATIVE DIFFERENTIAL RESISTANCE (NDR); QUALITATIVE ANALYTICAL MODELS; ROOM TEMPERATURE;

CRYSTAL GROWTH;

EID: 33847621110     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2709508     Document Type: Article

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