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Volumn 21, Issue 3-4, 2007, Pages 527-539
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Noninvasive laser probing of ultrashort single electron bunches for accelerator and light source development
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Author keywords
Accelerator diagnostics; Electro optics; Laser induced reflectance
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Indexed keywords
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EID: 33847389890
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/s0217979207042331 Document Type: Article |
Times cited : (6)
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References (22)
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