Analysis of terahertz pulse measurement with a chirped probe beam

Applied Physics Letters

Volumn 73, Issue 16, 1998, Pages 2233-2235

  Sun, F G ^a   Jiang, Zhiping ^a   Zhang, X C ^b  

^a Research Rensselaer Polytechnic Institute   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTROOPTICAL EFFECTS; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; INTEGRAL EQUATIONS; LASER PULSES; OPTICAL RESOLVING POWER; PROBES; SPECTROMETERS; SPECTRUM ANALYSIS; TIME DOMAIN ANALYSIS; WAVEFORM ANALYSIS;

CHIRPED PROBE BEAM; DIFFERENTIAL INTENSITY FUNCTION; GAUSSIAN FUNCTION; STATIONARY PHASE METHOD; TEMPORAL RESOLUTION; TERAHERTZ PULSE MEASUREMENT;

OPTICAL VARIABLES MEASUREMENT;

EID: 0032547626     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121685     Document Type: Article

References (6)

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4. P. Y. Han, Z. Jiang, J. A. Riordan, L. Wang, and X.-C. Zhang, Proc. SPIE 3277, 198 (1998).
5. J. A. Valdmanis, Solid State Technology/Test Measurement World, Nov. S40, 1986 (unpublished).
6. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, New York, 1980), p. 752.