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Volumn 2005, Issue , 2005, Pages 309-312

On the large-signal modelling of AlGaN/GaN HEMTs and SiC MESFETs

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; GALLIUM NITRIDE; MATHEMATICAL MODELS; MESFET DEVICES; SEMICONDUCTING ALUMINUM COMPOUNDS; SIGNAL THEORY;

EID: 33847335185     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (115)

References (12)
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    • June
    • R.J. Trew, "SiC and GaN transistors - is there one winner for microwave power applications?", Proceedings of the IEEE, vol. 90, pp. 1032-1047, June 2002.
    • (2002) Proceedings of the IEEE , vol.90 , pp. 1032-1047
    • Trew, R.J.1
  • 2
    • 0038426995 scopus 로고    scopus 로고
    • High-temperature electronics - a role for wide bandgap semiconductors?
    • June
    • P.G. Neudeck, R.S. Okojie, and Liang-Yu Chen, "High-temperature electronics - a role for wide bandgap semiconductors?", Proceedings of the IEEE, vol. 90, pp. 1065-1076, June 2002.
    • (2002) Proceedings of the IEEE , vol.90 , pp. 1065-1076
    • Neudeck, P.G.1    Okojie, R.S.2    Chen, L.3
  • 4
    • 0000220552 scopus 로고    scopus 로고
    • Trapping effects in GaN and SiC microwave FETs
    • June
    • S.C. Binari, P.B. Klein, and T.E. Kazior, "Trapping effects in GaN and SiC microwave FETs", Proceedings of the IEEE, vol. 90, pp. 1048-1058, June 2002.
    • (2002) Proceedings of the IEEE , vol.90 , pp. 1048-1058
    • Binari, S.C.1    Klein, P.B.2    Kazior, T.E.3
  • 5
    • 0025382934 scopus 로고
    • Modeling of frequency and temperature effects in GaAs MESFETs
    • Feb
    • P.C. Canfield, S.C. Lam, and D.J. Allstot, "Modeling of frequency and temperature effects in GaAs MESFETs", IEEE Journ. Solid State Circuits, vol. 25, no. 1, pp. 300-306, Feb. 1990.
    • (1990) IEEE Journ. Solid State Circuits , vol.25 , Issue.1 , pp. 300-306
    • Canfield, P.C.1    Lam, S.C.2    Allstot, D.J.3
  • 6
    • 0023999560 scopus 로고
    • A low-frequency GaAs MESFET circuit model
    • N. Scheinberg, R. Bayruns, and R. Goyal, "A low-frequency GaAs MESFET circuit model", Solid-State Circuit, vol. 23, pp. 605 - 608, 1988.
    • (1988) Solid-State Circuit , vol.23 , pp. 605-608
    • Scheinberg, N.1    Bayruns, R.2    Goyal, R.3
  • 7
    • 0025508044 scopus 로고
    • A self-backgating GaAs MESFET model for low-frequency anomalies
    • Oct
    • M. Lee et al "A self-backgating GaAs MESFET model for low-frequency anomalies", Electron Devices, IEEE Transactions on, vol. 37, pp. 2148-2157, Oct. 1990.
    • (1990) Electron Devices, IEEE Transactions on , vol.37 , pp. 2148-2157
    • Lee, M.1
  • 9
    • 8644284144 scopus 로고    scopus 로고
    • V. Desmaris, J. Eriksson, N. Rorsman, and H. Zirath, High CW power 0.3 μm gate AlGaN/GaN HEMTs grown by MBE on sapphire, Mater Sci Forum, v 457-460, n II, ICSCRM 2003, pp. 1629-1632, 2004.
    • V. Desmaris, J. Eriksson, N. Rorsman, and H. Zirath, "High CW power 0.3 μm gate AlGaN/GaN HEMTs grown by MBE on sapphire", Mater Sci Forum, v 457-460, n II, ICSCRM 2003, pp. 1629-1632, 2004.
  • 10
    • 8744291028 scopus 로고    scopus 로고
    • N. Rorsman, P. A. Nilsson, J. Eriksson, and H. Zirath, Investigation of the scalability of 4H-SiC MESFETs for high frequency applications, Mater Sci Forum, v 457-460, n II, ICSCRM 2003, pp. 1229-1232, 2004.
    • N. Rorsman, P. A. Nilsson, J. Eriksson, and H. Zirath, "Investigation of the scalability of 4H-SiC MESFETs for high frequency applications", Mater Sci Forum, v 457-460, n II, ICSCRM 2003, pp. 1229-1232, 2004.
  • 12
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    • ADS user manual
    • ADS user manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.