Nature of defects for bismuth layered thin films grown on Pt electrodes

Applied Physics Letters

Volumn 90, Issue 8, 2007, Pages

  Simoes A Z ^a   Cavalcante, L S ^a   Longo, E ^a   Varela, J A ^a   Riccardi, C S ^b   Mizaikoff, B ^b  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PIEZOELECTRIC COEFFICIENTS; PIEZORESPONSES;

BISMUTH COMPOUNDS; CRYSTAL DEFECTS; ELECTRODES; FILM GROWTH; PIEZOELECTRICITY; PLATINUM; STRONTIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 33847196371     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2472527     Document Type: Article

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