A new methodology for quantifying the multi-scale similarity of images

Microelectronic Engineering

Volumn 84, Issue 3, 2007, Pages 424-430

  Dalla Costa, M ^a   Bigerelle, M ^a   Najjar, D ^b  

^a UNIVERSITÉ DE TECHNOLOGIE DE COMPIÈGNE   (France)

^b UNIVERSITÉ LILLE 1   (France)

Author keywords

Abrasion; Information theory; Multi fractal; Multi scale self similarity

Indexed keywords

ABRASION; COMPUTER SIMULATION; FRACTALS; INFORMATION THEORY; MORPHOLOGY; OPTICAL DATA PROCESSING; PARAMETER ESTIMATION; PHOTOMETRY; PROBLEM SOLVING; SURFACE MEASUREMENT; THREE DIMENSIONAL;

ENGINEERING SURFACE; MORPHOLOGICAL TEXTURES; MULTI FRACTAL FORMALISM; MULTI SCALE SELF SIMILARITY;

IMAGE PROCESSING;

EID: 33846973001     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.10.068     Document Type: Article

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