The use of image analysis for sintering investigations: The example of CeO2 doped with TiO2

Journal of the European Ceramic Society

Volumn 25, Issue 15, 2005, Pages 3427-3435

  Coster, M ^a   Arnould, X ^a   Chermant, J L ^b   Chermant, L ^b   Chartier, T ^c  

^a CNRS   (France)

^b UNIVERSITÉ DE RENNES 1   (France)

^c Ecole Nationale Superieure de Ceramique Industrielle   (France)

Author keywords

CeO2; Image analysis; Microstructure; Sintering

Indexed keywords

CERIUM COMPOUNDS; DIFFUSION; DOPING (ADDITIVES); GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; MORPHOLOGY; PARAMETER ESTIMATION;

CERIA; MORPHOLOGICAL PARAMETERS; SPECIES; SURFACE AREA;

SINTERING;

MICROSTRUCTURE;

EID: 23244453150     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2004.09.003     Document Type: Article

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