Electrical hysteresis behavior of low temperature polycrystalline silicon thin film transistors

ECS Transactions

Volumn 3, Issue 8, 2006, Pages 57-62

  Nam, Dae Hyun ^a   Lee, Hong Koo ^a   Jung, Sang Hoon ^a   Ahn, Tae Joon ^a   Kim, Chang Yeon ^a   Kim, Chang Dong ^a   Chung, In Jae ^a  

^a LG Display Co Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRAPS; LIGHT EMITTING DIODES; MAGNETIC HYSTERESIS; POLYSILICON;

ELECTRICAL HYSTERESIS; IMAGE STICKING; TRAPPING RATE;

THIN FILM TRANSISTORS;

EID: 33846958440     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2356334     Document Type: Conference Paper

References (4)

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