Cluster induced chemistry at solid surfaces: Molecular dynamics simulations of keV C60 bombardment of Si

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 255, Issue 1 SPEC. ISS., 2007, Pages 238-241

  Krantzman, K D ^a   Kingsbury, D B ^a   Garrison, Barbara J ^b  

^a School of Business   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

C60 +; Cluster ion; Molecular dynamics simulations; Si; Sputtering; ToF SIMS

Indexed keywords

CHEMICAL BONDS; COMPUTER SIMULATION; ION BOMBARDMENT; KINETIC ENERGY; SILICON; SPUTTERING;

CLUSTER ION; MOLECULAR DYNAMICS SIMULATIONS; TOF-SIMS;

MOLECULAR DYNAMICS;

EID: 33846932504     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.11.079     Document Type: Article

References (26)

1. Appelhans A.D., and Delmore J.E. Anal. Chem. 61 (1989) 1093
2. Blain M.G., Della-Negra S., Jort H., LeBeyec Y., and Schweikert E.A. Phys. Rev. Lett. 63 (1989) 1625
3. Castner D.G. Nature 422 (2003) 129
4. van Stipdonk M.J., Harris R.D., and Schweikert E.A. Rapid Commun. Mass Spectrom. 10 (1996) 1987
5. Hill R., and Blenkinsopp P.W.M. Appl. Surf. Sci. 231 (2004) 936
6. Xu J., Szakal C.W., Martin S.E., Peterson B.R., Wucher A., and Winograd N. J. Am. Chem. Soc. 126 (2004) 3904
7. Townes J.A., White A.K., Wiggins E.N., Krantzman K.D., Garrison B.J., and Winograd N. J. Phys. Chem. A 24 (1999) 4587
8. Nguyen T.C., Ward D.W., Townes J.A., White A.K., Krantzman K.D., and Garrison B.J. J. Phys. Chem. B 104 (2000) 8221
9. Postawa Z., Czerwinkski B., Szewczyk M., Smiley E.J., Winograd N., and Garrison B.J. Anal. Chem. 75 (2003) 4402
10. Postawa Z., Czerwinski B., Szewczyk M., Smiley E.J., Winograd N., and Garrison B.J. J. Phys. Chem. B 126 (2004) 7831
11. Winograd N. Anal. Chem. 77 (2004) 143A
12. Xu J.J., Ostrowski S., Ewing A.G., and Winograd N. Appl. Surf. Sci. 231-232 (2004) 159
13. Cheng J., and Winograd N. Anal. Chem. 77 (2005) 3651
14. G. Gillen, Private Communication, 18th Annual SIMS Workshop, Hilton Head, SC, May 2-5, 2005.
15. Gillen G., Batteas J., Michaels C.A., Chi P., Small J., Windsor E., Fahey A., Verkouteren J., and Kim K.J. Appl. Surf. Sci. 252 (2006) 6521
16. Krantzman K.D., Kingsbury D.B., and Garrison B.J. Appl. Surf. Sci. 252 (2006) 6463
17. Beardmore K.M., Smith R., and Webb R.P. Model. Simul. Mater. Sci. 2 (1994) 313
18. Smith R., and Beardmore K. Thin Solid Films 272 (1996) 255
19. Medvedeva M., Wojciechowski I., and Garrison B.J. Surf. Sci. 505 (2002) 349
20. Garrison B.J., Delcorte A., and Krantzman K.D. Acc. Chem. Res. 33 (2000) 69
21. Garrison B.J. In: Vickerman J.C., and Briggs D. (Eds). Tof-SIMS: Surface Analysis by Mass Spectrometry (2001), SurfaceSpectra Ltd. and IM Publications, Manchester/Chichester, UK 223
22. Tersoff J. Phys. Rev. B 39 (1989) 5566
23. Ziegler J.F., Biersack J.P., and Littmark U. The Stopping and Range of Ions in Solids (1985), Permamon Press, New York
24. Belko V., Posselt M., and Chagarov E. Nucl. Instr. and Meth. B 202 (2003) 18
25. Zimmerman S., and Urbassek H.M. Eur. Phys. J. D 39 (2006) 442
26. Russo Jr. M.F., and Garrison B.J. Anal. Chem. 78 (2006) 8317