A six-circle diffractometer system for synchrotron X-ray studies of surfaces and thin film growth by molecular beam epitaxy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 572, Issue 2, 2007, Pages 942-947

  Hong, Hawoong ^a   Chiang, T C ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Low temperatures; Molecular beam epitaxy; X ray diffractometer; X ray surface diffraction

Indexed keywords

ANNEALING; CAMERAS; CHARGE COUPLED DEVICES; DEPOSITION; ELECTRON BEAMS; ELECTRON SCATTERING; HIGH TEMPERATURE OPERATIONS; MOLECULAR BEAM EPITAXY; SYNCHROTRON RADIATION; THERMOCOUPLES; THIN FILMS; ULTRAHIGH VACUUM; X RAY DIFFRACTION ANALYSIS; X RAYS;

LIQUID NITROGEN; LOW TEMPERATURES; SURFACE DIFFRACTOMETER; X-RAY SURFACE DIFFRACTION;

DIFFRACTOMETERS;

EID: 33846924777     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.11.056     Document Type: Article

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