Time-resolved reflection surface x-ray diffraction

Review of Scientific Instruments

Volumn 73, Issue 4, 2002, Pages 1720-

  Hong, Hawoong ^a   Wu, Z ^a   Chiang, T C ^a   Zschack, P ^a   Chen, Haydn ^a  

^a University of Illinois at Urbana Champaign   (United States)

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EID: 0036541277     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1435823     Document Type: Article

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