On the specific contact resistance of metal contacts to p-type GaN

Semiconductor Science and Technology

Volumn 21, Issue 12, 2006, Pages 1738-1742

  Lewis, L ^a   Maaskant, P P ^a   Corbett, B ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURRENT DENSITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE MEASUREMENT; GALLIUM NITRIDE; TRANSPORT PROPERTIES; VOLTAGE MEASUREMENT;

CIRCULAR TRANSMISSION LINE MEASUREMENTS; INTRINSIC DIODES; SUBMICRON ERRORS;

ELECTRIC RESISTANCE;

EID: 33846885455     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/12/041     Document Type: Article

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