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Volumn 85, Issue 24, 2004, Pages 6033-6035
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Characterization of bulk and surface currents in strain-balanced InGaAs quantum-well mesa diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
LEAKAGE CURRENTS;
PLASMAS;
SEMICONDUCTOR DIODES;
DIFFUSIVE CURRENTS;
RECOMBINATION CURRENTS;
STRAIN BALANCED MULTIPLE QUANTUM WELLS (SB-MQW);
SURFACE CURRENTS;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 20444439953
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1835537 Document Type: Article |
Times cited : (5)
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References (11)
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