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Volumn 85, Issue 24, 2004, Pages 6033-6035

Characterization of bulk and surface currents in strain-balanced InGaAs quantum-well mesa diodes

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; PLASMAS; SEMICONDUCTOR DIODES;

EID: 20444439953     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1835537     Document Type: Article
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.