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Volumn 6349 II, Issue , 2006, Pages

Fast dual graph based hotspot detection

Author keywords

[No Author keywords available]

Indexed keywords

HOTSPOT DETECTION; MASS PRODUCTION; PARAMETRIC YIELD; PATTERNING FIDELITY;

EID: 33846570490     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.692949     Document Type: Conference Paper
Times cited : (45)

References (7)
  • 6
    • 2942648580 scopus 로고    scopus 로고
    • Layout Printability Optimization Using a Silicon Simulation Methodology
    • M. Cote and P. Hurat, "Layout Printability Optimization Using a Silicon Simulation Methodology", 2004, Intl. Symp. on Quality of Electronic Design, pp. 159-164.
    • (2004) Intl. Symp. on Quality of Electronic Design , pp. 159-164
    • Cote, M.1    Hurat, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.