Advanced numerical prototyping methods in modern engineering applications - Optimisation for micro-electronic package reliability

Microelectronics Reliability

Volumn 47, Issue 2-3, 2007, Pages 280-289

  Wymyslowski A ^a   van Driel, W D ^b   van de Peer, J ^c   Tzannetakis, N ^c   Zhang, G Q ^b,d  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b NXP SEMICONDUCTORS   (Netherlands)

^c LMS Numerical Technologies   (Belgium)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COST EFFECTIVENESS; ITERATIVE METHODS; MICROELECTRONICS; NUMERICAL METHODS; OPTIMIZATION; RELIABILITY THEORY;

DESIGN OF EXPERIMENTS; OPTIMAL DESIGNS; PHYSICAL PROTOTYPING; RESPONSE SURFACE MODELING;

ELECTRONICS PACKAGING;

EID: 33846563513     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.09.007     Document Type: Article

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