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Volumn 39, Issue 1, 2007, Pages 58-63

Atomic force microscopy imaging of ZnO nanodots deposited on quartz by sparking off different tip shapes

Author keywords

AFM; Nanodots; Sparking; Zinc oxide

Indexed keywords

ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; DEPOSITION; IMAGE ANALYSIS; NUCLEATION; QUARTZ; ULTRAVIOLET SPECTROSCOPY; ZINC OXIDE;

EID: 33846549951     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2507     Document Type: Article
Times cited : (21)

References (27)
  • 2
    • 2542419106 scopus 로고    scopus 로고
    • Chik H, Liang J, Cloutier SG, Kouklin N, Xu JM. Appl. Phys. Lett. 2004; 84: 3376.
    • Chik H, Liang J, Cloutier SG, Kouklin N, Xu JM. Appl. Phys. Lett. 2004; 84: 3376.
  • 22
    • 25644431892 scopus 로고    scopus 로고
    • Wang Q, Wang G, Jie J, Han X, Hu B, Hou JG. Thin Solid Films 2005; 492: 61.
    • Wang Q, Wang G, Jie J, Han X, Hu B, Hou JG. Thin Solid Films 2005; 492: 61.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.