n-ZnO/p-Si UV photodetectors employing AlOx films for antireflection

Thin Solid Films

Volumn 447-448, Issue , 2004, Pages 111-114

  Jeong, I S ^a   Kim, J H ^a   Park, Hyung Ho ^a   Im, Seongil ^a  

^a Yonsei University   (South Korea)

Author keywords

Aluminum oxide; Photodiode; Reflectance; Zinc oxide

Indexed keywords

ALUMINA; ANTIREFLECTION COATINGS; CURRENT VOLTAGE CHARACTERISTICS; PHOTOCURRENTS; PHOTODIODES; PHOTONS; REFLECTION; THIN FILMS; ZINC OXIDE;

BANDGAPS; SPECTRAL RESPONSIVITY;

PHOTODETECTORS;

EID: 1342302490     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.09.032     Document Type: Conference Paper

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