Scanning texture analysis of lamellar bone using microbeam synchrotron X-ray radiation

Journal of Applied Crystallography

Volumn 40, Issue 1, 2007, Pages 115-120

  Wagermaier, Wolfgang ^a   Gupta, Himadri S ^a   Gourrier, Aurélien ^a   Paris, Oskar ^a   Roschger, Paul ^b   Burghammer, Manfred ^c   Riekel, Christian ^c   Fratzl, Peter ^a  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^b HANUSCH HOSPITAL   (Austria)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Bone; Synchrotron X ray radiation; Texture analysis; Wide angle X ray diffraction (WAXD)

Indexed keywords

EID: 33846526075     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806044888     Document Type: Article

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