Quantitative texture analysis of small domains with synchrotron radiation X-rays

Journal of Applied Crystallography

Volumn 32, Issue 5, 1999, Pages 841-849

  Heidelbach, F ^a   Riekel, C ^a   Wenk, H R ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001000751     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899004999     Document Type: Article

References (8)

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4. Poulsen, H. F., Garbe, S., Lorentzen, T., Juul Jensen, D., Poulsen, F. W., Andersen, N. H., Frello, T., Feidenhans'l, R. & Graafsma, H. (1997). J. Synchrotron Rad. 4, 147-154.
5. Reeves, A., Le Gouic, F., Pannetier, J., Anne, M., Bordet, P. & Hodeau, J. L. (1996). Mater. Sci. Forum, 217-222, 595.
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7. Riekel, C., Cedola, A., Heidelbach, F. & Wagner, K. (1997). Macromolecules, 30, 1033-1037.
8. Roe, R.-J. (1965), J. Appl. Phys. 36, 2024-2031.