XAFS applications in semiconductors

Nuclear Science and Techniques/Hewuli

Volumn 17, Issue 6, 2006, Pages 370-388

  Wei, Shi Qiang ^a   Sun, Zhi Hu ^a   Pan, Zhi Yun ^a   Zhang, Xin Yi ^b   Yan, Wen Sheng ^a   Zhong, Wen Jie ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b FUDAN UNIVERSITY   (China)

Author keywords

Local structures; Semiconductor quantum system; Synchrotron radiation; X ray absorption fine structure (XAFS)

Indexed keywords

EID: 33846512260     PISSN: 10018042     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1001-8042(07)60006-2     Document Type: Article

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