A new approach to full multiple-scattering XAFS calculation

Surface Science

Volumn 357-358, Issue , 1996, Pages 60-64

  Fujikawa, T ^a   Yiwata, N ^b  

^a CHIBA UNIVERSITY   (Japan)

^b RICOH COMPANY LTD   (Japan)

Author keywords

Near edge extended X ray absorption fine structure (NEXAFS); X ray absorption spectroscopy

Indexed keywords

CALCULATIONS; COMPUTATIONAL METHODS; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY; X RAYS;

FREE ELECTRON PROPAGATORS; MULTIPLE SCATTERING THEORY; NEAR EDGE EXTENDED X RAY ABSORPTION FINE STRUCTURE; PARTITIONING METHOD; X RAY ABSORPTION SPECTROSCOPY;

SURFACE PHENOMENA;

EID: 0030167880     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00058-1     Document Type: Article

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