Surface plasmon mediated near-field imaging and optical addressing in nanoscience

Micron

Volumn 38, Issue 4, 2007, Pages 427-437

  Drezet, A ^a   Hohenau, A ^a   Krenn, J R ^a   Brun, M ^b   Huant, S ^c  

^a UNIVERSITY OF GRAZ   (Austria)

^b CEA LETI   (France)

^c LIPHY   (France)

Author keywords

Leakage radiation microscopy; Near field microscopy; Surface plasmon polariton

Indexed keywords

NEAR FIELD SCANNING OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SURFACE PLASMON RESONANCE;

LEAKAGE RADIATION MICROSCOPY; OPTICAL NEAR-FIELD MICROSCOPY; SURFACE PLASMON POLARITON;

NANOTECHNOLOGY;

EID: 33846438675     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2006.06.011     Document Type: Article

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