Electronic bonding transition in compressed SiO2 glass

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 1, 2007, Pages

  Lin, Jung Fu ^a   Fukui, Hiroshi ^b   Prendergast, David ^c,d   Okuchi, Takuo ^e   Cai, Yong Q ^f   Hiraoka, Nozomu ^f   Yoo, Choong Shik ^a   Trave, Andrea ^a   Eng, Peter ^g   Hu, Michael Y ^h   Chow, Paul ^h  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b OKAYAMA UNIVERSITY   (Japan)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e NAGOYA UNIVERSITY   (Japan)

^f NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^g UNIVERSITY OF CHICAGO   (United States)

^h ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846367792     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.012201     Document Type: Article

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