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EPJ Applied Physics

Volumn 36, Issue 3, 2006, Pages 215-218

Study of traps in polydiacetylene based devices using TSC technique

(5) Renaud, C a Huang, C H a,b Zemmouri, M a Le Rendu, P a Nguyen, T P a

a UNIVERSITÉ DE NANTES (France)

b NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CATHODES; COPOLYMERS; ELECTRIC CURRENTS; SEMICONDUCTOR DEVICES;

DEVICE STRUCTURE; ELECTRON-LIKE TRAPS; THERMALLY STIMULATED CURRENT (TSC);

ELECTRON TRAPS;

EID: 33846360751 PISSN: 12860042 EISSN: 12860050 Source Type: Journal
DOI: 10.1051/epjap:2006139 Document Type: Article

Times cited : (10)

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