Force measurement with a scanning tunneling microscope

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 3, 2007, Pages

  Braun, K F ^a   Hla, S W ^a  

^a OHIO UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846349241     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.033406     Document Type: Article

References (16)

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