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1
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0009054651
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McGraw-Hill, New York
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J. H. Lau, C. P. Wong, N. C. Lee and S. W. R. Lee, Electronics Manufacturing with Lead-free, Halogen-free and Conductive-adhesive materials, McGraw-Hill, New York, (2003).
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(2003)
Electronics Manufacturing with Lead-free, Halogen-free and Conductive-adhesive materials
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Lau, J.H.1
Wong, C.P.2
Lee, N.C.3
Lee, S.W.R.4
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3
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9744276822
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Researcg Update: Lead Free Solder Alternatives
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J. Bath, C. Handwerker, and E. Bradley, "Researcg Update: Lead Free Solder Alternatives," Circuits Assembly, 11, (2000), pp. 45-52.
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(2000)
Circuits Assembly
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Bath, J.1
Handwerker, C.2
Bradley, E.3
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4
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32844462031
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On Measurement of Effective Silicon Backend Strength using Bump Pull/Shear Techniques
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San Francisco, CA, July
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S. Sane, S. Tandon, and B, Chandran, "On Measurement of Effective Silicon Backend Strength using Bump Pull/Shear Techniques," Proc. ASME InterPACK 2005, San Francisco, CA, July (2005).
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(2005)
Proc. ASME InterPACK 2005
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Sane, S.1
Tandon, S.2
Chandran, B.3
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5
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32844467143
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Solder Joint Reliability Improvement using the Cold Ball Pull Metrology
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San Francisco, CA, July
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George F. Kaiser and Dudi Amir, "Solder Joint Reliability Improvement using the Cold Ball Pull Metrology," Proc. ASME InterPACK 2005, San Francisco, CA, July (2005).
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(2005)
Proc. ASME InterPACK 2005
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Kaiser, G.F.1
Amir, D.2
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6
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24644432659
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EGA Brittle Fracture-Alternative Solder joint Integrity Test Methods
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Orlando, FL, June
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K. Newman, "EGA Brittle Fracture-Alternative Solder joint Integrity Test Methods," Proc. 55th Electronic Components and Technology Conference, Orlando, FL, June (2005), pp. 1194-1200.
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(2005)
Proc. 55th Electronic Components and Technology Conference
, pp. 1194-1200
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Newman, K.1
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7
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0036401045
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Ball Shear Versus Ball Pull Test Methods for Evaluating interfacial Failures in Area Array Packages
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July, San Jose, CA, pp
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R. J. Coyle and A. J. Serafma, "Ball Shear Versus Ball Pull Test Methods for Evaluating interfacial Failures in Area Array Packages," Proc. International Electronics Manufacturing Technology(IEMT) Symposium, July 2002, San Jose, CA, pp. 200-205.
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(2002)
Proc. International Electronics Manufacturing Technology(IEMT) Symposium
, pp. 200-205
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Coyle, R.J.1
Serafma, A.J.2
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8
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0034835530
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Characterization and Analysis on the Solder Ball Shear Testing Conditions
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Orlando, FL, June
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X. Huang, S. W. R. Lee, C. C. Yan and S. Hui, "Characterization and Analysis on the Solder Ball Shear Testing Conditions," Proc. 51th Electronic Components and Technology Conference, Orlando, FL, June (2001), pp. 1065-1071.
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(2001)
Proc. 51th Electronic Components and Technology Conference
, pp. 1065-1071
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Huang, X.1
Lee, S.W.R.2
Yan, C.C.3
Hui, S.4
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9
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0036864534
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3Sn Plate Formation in the Solidification of Near-ternary Eutectic Sn-Ag-Cu Alloys
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Nov
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3Sn Plate Formation in the Solidification of Near-ternary Eutectic Sn-Ag-Cu Alloys," Journal of Materials Research, 17(11), Nov (2002), pp. 2775-2777.
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(2002)
Journal of Materials Research
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Henderson, D.W.1
Gosselin, T.2
Sarkhel, A.3
Kang, S.K.4
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10
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0038487318
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3Sn Plate Formation in the Solidification of Near-Ternary Eutectic Sn-Ag-Cu
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June
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3Sn Plate Formation in the Solidification of Near-Ternary Eutectic Sn-Ag-Cu," JOM : the Journal of the Minerals, Metals & Materials Society, 55(6), June (2003), pp. 61-65.
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(2003)
JOM : The Journal of the Minerals, Metals & Materials Society
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, Issue.6
, pp. 61-65
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Kang, S.K.1
Choi, W.K.2
Shih, D.3
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11
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0038351737
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3Sn Plates in Sn-Ag-Cu Alloys and Optimization of their Alloy Composition
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New Orleans, LA, May
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3Sn Plates in Sn-Ag-Cu Alloys and Optimization of their Alloy Composition," Proc. 53th Electronic Components and Technology Conference, New Orleans, LA, May (2003), pp. 64-70.
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(2003)
Proc. 53th Electronic Components and Technology Conference
, pp. 64-70
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Kang, S.K.1
Choi, W.K.2
Henderson, D.W.3
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12
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33645069428
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Experimental Investigation of the Effect of Reflow Cooling Rate on the IMC Growth of SAC Lead-free Solder Alloy
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Orlando, FL, November
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F.B. Song and S. W. R. Lee, "Experimental Investigation of the Effect of Reflow Cooling Rate on the IMC Growth of SAC Lead-free Solder Alloy," ASME International Mechanical Engineering Congress, Orlando, FL, November (2005).
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(2005)
ASME International Mechanical Engineering Congress
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Song, F.B.1
Lee, S.W.R.2
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14
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0034821493
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Studies on Ni-Sn intermetallic Compound and P-rich Ni Layer at the Electroless Nickel UBM Solder Interface and Their Effects on Flip Chip Solder Joint Reliability
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Orlando, FL, May
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Y. D. Jeon and K. W. Paik, "Studies on Ni-Sn intermetallic Compound and P-rich Ni Layer at the Electroless Nickel UBM Solder Interface and Their Effects on Flip Chip Solder Joint Reliability," Proc. 51th Electronic Components and Technology Conference, Orlando, FL, May (2001), pp 1326-1332.
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(2001)
Proc. 51th Electronic Components and Technology Conference
, pp. 1326-1332
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Jeon, Y.D.1
Paik, K.W.2
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15
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0036665630
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Microstructure, Joint Strength and Failure Mechanisms of SnPb and Pb-free Solders in EGA Packages
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M. L Lee, D.R. Olsen, and W. T. Chen, "Microstructure, Joint Strength and Failure Mechanisms of SnPb and Pb-free Solders in EGA Packages," IEEE Transactions on Electronics Packaging, Vol. 25, (2002), pp. 185-191.
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(2002)
IEEE Transactions on Electronics Packaging
, vol.25
, pp. 185-191
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Lee, M.L.1
Olsen, D.R.2
Chen, W.T.3
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16
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0035023772
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Shear Property and Microstructure Evaluation of Pb-free Solder Bumps under Room Temperature and Multiple Reflow/High Temperature Aging
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Braselton, GA, March
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L. Li, J. W. Jang and B. Allmen, "Shear Property and Microstructure Evaluation of Pb-free Solder Bumps under Room Temperature and Multiple Reflow/High Temperature Aging," Proc. 2001 International Symposium on Advanced packaging Materials, Braselton, GA, March (2001), pp. 347-353.
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(2001)
Proc. 2001 International Symposium on Advanced packaging Materials
, pp. 347-353
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Li, L.1
Jang, J.W.2
Allmen, B.3
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