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Volumn 2005, Issue , 2005, Pages

Effects of testing conditions and multiple reflows on cold bump pull test of Pb-free solder balls

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE FRACTURE; FAILURE (MECHANICAL); INTERFACES (MATERIALS); MATERIALS TESTING; STRENGTH OF MATERIALS;

EID: 33846291380     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2005.1564698     Document Type: Conference Paper
Times cited : (12)

References (16)
  • 3
    • 9744276822 scopus 로고    scopus 로고
    • Researcg Update: Lead Free Solder Alternatives
    • J. Bath, C. Handwerker, and E. Bradley, "Researcg Update: Lead Free Solder Alternatives," Circuits Assembly, 11, (2000), pp. 45-52.
    • (2000) Circuits Assembly , vol.11 , pp. 45-52
    • Bath, J.1    Handwerker, C.2    Bradley, E.3
  • 4
    • 32844462031 scopus 로고    scopus 로고
    • On Measurement of Effective Silicon Backend Strength using Bump Pull/Shear Techniques
    • San Francisco, CA, July
    • S. Sane, S. Tandon, and B, Chandran, "On Measurement of Effective Silicon Backend Strength using Bump Pull/Shear Techniques," Proc. ASME InterPACK 2005, San Francisco, CA, July (2005).
    • (2005) Proc. ASME InterPACK 2005
    • Sane, S.1    Tandon, S.2    Chandran, B.3
  • 5
    • 32844467143 scopus 로고    scopus 로고
    • Solder Joint Reliability Improvement using the Cold Ball Pull Metrology
    • San Francisco, CA, July
    • George F. Kaiser and Dudi Amir, "Solder Joint Reliability Improvement using the Cold Ball Pull Metrology," Proc. ASME InterPACK 2005, San Francisco, CA, July (2005).
    • (2005) Proc. ASME InterPACK 2005
    • Kaiser, G.F.1    Amir, D.2
  • 6
    • 24644432659 scopus 로고    scopus 로고
    • EGA Brittle Fracture-Alternative Solder joint Integrity Test Methods
    • Orlando, FL, June
    • K. Newman, "EGA Brittle Fracture-Alternative Solder joint Integrity Test Methods," Proc. 55th Electronic Components and Technology Conference, Orlando, FL, June (2005), pp. 1194-1200.
    • (2005) Proc. 55th Electronic Components and Technology Conference , pp. 1194-1200
    • Newman, K.1
  • 7
    • 0036401045 scopus 로고    scopus 로고
    • Ball Shear Versus Ball Pull Test Methods for Evaluating interfacial Failures in Area Array Packages
    • July, San Jose, CA, pp
    • R. J. Coyle and A. J. Serafma, "Ball Shear Versus Ball Pull Test Methods for Evaluating interfacial Failures in Area Array Packages," Proc. International Electronics Manufacturing Technology(IEMT) Symposium, July 2002, San Jose, CA, pp. 200-205.
    • (2002) Proc. International Electronics Manufacturing Technology(IEMT) Symposium , pp. 200-205
    • Coyle, R.J.1    Serafma, A.J.2
  • 12
    • 33645069428 scopus 로고    scopus 로고
    • Experimental Investigation of the Effect of Reflow Cooling Rate on the IMC Growth of SAC Lead-free Solder Alloy
    • Orlando, FL, November
    • F.B. Song and S. W. R. Lee, "Experimental Investigation of the Effect of Reflow Cooling Rate on the IMC Growth of SAC Lead-free Solder Alloy," ASME International Mechanical Engineering Congress, Orlando, FL, November (2005).
    • (2005) ASME International Mechanical Engineering Congress
    • Song, F.B.1    Lee, S.W.R.2
  • 13
    • 33846266288 scopus 로고    scopus 로고
    • The Black Pad Failure Mechanism - From Beginning to End
    • Sep
    • R. A. Bulwith, M. Trosky and L. M. Picchione, "The Black Pad Failure Mechanism - From Beginning to End," Global SMT & Packaging, Sep (2002), pp. 9-13.
    • (2002) Global SMT & Packaging , pp. 9-13
    • Bulwith, R.A.1    Trosky, M.2    Picchione, L.M.3
  • 14
    • 0034821493 scopus 로고    scopus 로고
    • Studies on Ni-Sn intermetallic Compound and P-rich Ni Layer at the Electroless Nickel UBM Solder Interface and Their Effects on Flip Chip Solder Joint Reliability
    • Orlando, FL, May
    • Y. D. Jeon and K. W. Paik, "Studies on Ni-Sn intermetallic Compound and P-rich Ni Layer at the Electroless Nickel UBM Solder Interface and Their Effects on Flip Chip Solder Joint Reliability," Proc. 51th Electronic Components and Technology Conference, Orlando, FL, May (2001), pp 1326-1332.
    • (2001) Proc. 51th Electronic Components and Technology Conference , pp. 1326-1332
    • Jeon, Y.D.1    Paik, K.W.2
  • 15
    • 0036665630 scopus 로고    scopus 로고
    • Microstructure, Joint Strength and Failure Mechanisms of SnPb and Pb-free Solders in EGA Packages
    • M. L Lee, D.R. Olsen, and W. T. Chen, "Microstructure, Joint Strength and Failure Mechanisms of SnPb and Pb-free Solders in EGA Packages," IEEE Transactions on Electronics Packaging, Vol. 25, (2002), pp. 185-191.
    • (2002) IEEE Transactions on Electronics Packaging , vol.25 , pp. 185-191
    • Lee, M.L.1    Olsen, D.R.2    Chen, W.T.3
  • 16
    • 0035023772 scopus 로고    scopus 로고
    • Shear Property and Microstructure Evaluation of Pb-free Solder Bumps under Room Temperature and Multiple Reflow/High Temperature Aging
    • Braselton, GA, March
    • L. Li, J. W. Jang and B. Allmen, "Shear Property and Microstructure Evaluation of Pb-free Solder Bumps under Room Temperature and Multiple Reflow/High Temperature Aging," Proc. 2001 International Symposium on Advanced packaging Materials, Braselton, GA, March (2001), pp. 347-353.
    • (2001) Proc. 2001 International Symposium on Advanced packaging Materials , pp. 347-353
    • Li, L.1    Jang, J.W.2    Allmen, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.