Measurement of the thermal conductance of silicon nanowires at low temperature

Journal of Applied Physics

Volumn 101, Issue 1, 2007, Pages

  Bourgeois, Olivier ^a   Fournier, Thierry ^a   Chaussy, Jacques ^a  

^a GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; LOW TEMPERATURE EFFECTS; PHONONS; SILICON; SINGLE CRYSTALS; THERMAL CONDUCTIVITY;

INSULATOR SUBSTRATES; PHONON WAVEGUIDES; PHONON WAVELENGTH;

NANOSTRUCTURED MATERIALS;

EID: 33846269671     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2400093     Document Type: Article

References (26)

1. K. Schwab, E. A. Henricksen, J. M. Worlock, and M. L. Roukes, Nature (London) 404, 974 (2000).
2. C. S. Yung, D. R. Schmidt, and A. N. Cleland, Appl. Phys. Lett. 81, 31 (2002).
3. M. S. Dresselhaus, Proceedings of the 2003 Rohsenow Symposium on Future Trends in Heat Transfer., 2003 (unpublished).
4. D. Li, Y. Wu, R. Fan, P. Yang, and A. Majumdar, Appl. Phys. Lett. 83, 3186 (2003).
5. D. G. Cahill, W. K. Ford, K. E. Goodson, G. D. Mahan, A. Majundar, H. J. Maris, R. Merlin, and S. R. Phillpot, J. Appl. Phys. 93, 793 (2003).
6. A. Lindell, J. Mattila, P. S. Deo, M. Manninen, and J. Pekola, Physica B 284, 1884 (2000).
7. O. Bourgeois, S. Skipetrov, F. Ong, and J. Chaussy, Phys. Rev. Lett. 94, 057007 (2005).
8. M. L. Roukes, Physica B 263-264, 1 (1999).
9. L. G. C. Rego and G. Kirczenow, Phys. Rev. Lett. 81, 232 (1998).
10. D. V. Anghel, J. P. Pekola, M. M. Leivo, J. K. Suoknuuti, and M. Manninen, Phys. Rev. Lett. 81, 2958 (1998).
11. A. Bezryadin, A. Buzdin, and B. Pannetier, Phys. Rev. B 51, 3718 (1995).
12. R. Maynard and E. Akkermans, Phys. Rev. B 32, 5440 (1985).
13. J. B. Pendry, J. Phys. A 16, 2161 (1983).
14. S. Lloyd, V. Giovannetti, and L. Maccone, Phys. Rev. Lett. 93, 100501 (2004).
15. M. P. Blencowe and V. Vitelli, Phys. Rev. A 62, 052104 (2000).
16. M. M. Leivo and J. P. Pekola, Appl. Phys. Lett. 72, 1305 (1998).
17. W. Holmes, J. M. Gildemeister, P. L. Richards, and V. Kotsubo, Appl. Phys. Lett. 72, 2250 (1998).
18. D. G. Cahill, Rev. Sci. Instrum. 61, 802 (1990).
19. L. Lu, W. Yi, and D. L. Zhang, Rev. Sci. Instrum. 72, 2996 (2001).
20. R. Cabanel, J. Chaussy, J. Mazuer, and J.-C. Villegier, Thin Solid Films 185, 145 (1990).
21. C. Castellani, C. DiCastro, G. Koltiar, P. A. Lee, and G. Strinati, Phys. Rev. Lett. 59, 477 (1987).
22. J. M. Ziman, Electrons and Phonons (Clarendon, Oxford, 2001).
23. H. B. G. Casimir, Physica (Amsterdam) 5, 595 (1938).
24. R. Berman, E. L. Foster, and J. M. Ziman, Proc. R. Soc. London, Ser. A 231, 130 (1955).
25. C. Buzzi, Ph.D. thesis, Universit́ Joseph Fourier, 1999.
26. L. Pescini, A. Tilke, R. H. Blick, H. Lorenz, J. P. Kotthaus, W. Eberhardt, and D. Kern, Nanotechnology 10, 418 (1999).