The Raman spectroscopy of neutron transmutation doping isotope 74Germanium nanocrystals embedded in SiO2 matrix

Solid State Communications

Volumn 141, Issue 9, 2007, Pages 514-518

  Hu, Youwen ^a   Lu, Tiecheng ^a,b   Dun, Shaobo ^a   Hu, Qiang ^a   Huang, Ningkang ^a   Zhang, Songbao ^c   Tang, Bin ^c   Dai, Junlong ^c   Resnick, Lev ^d   Shlimak, Issai ^d   Zhu, Sha ^e   Wei, Qiangmin ^e   Wang, Lumin ^e  

^a SICHUAN UNIVERSITY   (China)

^b INTERNATIONAL CENTRE FOR MATERIALS PHYSICS   (China)

^c RESEARCH CENTER OF LASER FUSION   (China)

^d BAR ILAN UNIVERSITY   (Israel)

^e UNIVERSITY OF MICHIGAN   (United States)

Author keywords

A. Isotope Ge nanocrystals; B. Transmuted impurities; E. Laser Raman scattering; E. Neutron transmutation doping

Indexed keywords

GERMANIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ISOTOPE GE NANOCRYSTALS; LASER RAMAN SCATTERING; NEUTRON TRANSMUTATION DOPING; TRANSMUTED IMPURITIES;

NEUTRON DIFFRACTION;

EID: 33846242611     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2006.12.001     Document Type: Article

References (24)

1. Canham L.T. Appl. Phys. Lett. 57 (1990) 1046
2. Fujii M., Hayashi S., and Yamamoto K. J. Appl. Phys. 83 (1998) 7953
3. Fujii M., Hayashi S., and Yamamoto K. Japan. J. Appl. Phys. 30 4 (1991) 687-694
4. Kuriyama K., Sakai K., and Okada M. Phys. Rev. B 53 (1996) 987
5. Nakano N., Marville L., and Reif R. J. Appl. Phys. 72 (1992) 3641
6. Wu X.L., Mei Y.F., Siu G.G., Wong K.L., Moulding K., Stokes M.J., Fu C.L., and Bao X.M. Phys. Rev. Lett. 86 (2001) 3000
7. Heng C.L., Finstad T.G., Li Y.J., Gunnaes A.E., Olsen A., and Storȧs P. Micoroelectron. J. 36 (2005) 531
8. Kanzawa Y., Fujii M., Hayashi S., and Yamamoto K. Solid State Commun. 100 4 (1996) 227
9. Nickel N.H., Lengsfeld P., and Sieber I. Phys. Rev. B 61 (2000) 15558
10. Maeda Y. Phys. Rev. B 51 3 (1995) 1658
11. Wu X.L., Gao T., Bao X.M., Yan F., Jiang S.S., and Feng D. J. Appl. Phys. 82 5 (1997) 2704
12. Wang X., Jiang Z., Zhu H., Lu F., Huang D., Liu X., Hi C., Chen Y., Zhu Z., and Yao T. Appl. Phys. Lett. 71 (1997) 3543
13. Liu J.L., Tang Y.S., Wang K.L., Radetic T., and Gronsky R. Appl. Phys. Lett. 74 (1999) 1863
14. Craciun V., Boulmer-Leborgne C., Nicolls E.J., and Boyd I.W. Appl. Phys. Lett. 69 (1996) 1506
15. Haller E.E. J. Appl. Phys. 77 (1995) 2857
16. Sasaki Y., and Horie C. Phys. Rev. B 47 7 (1993) 3811
17. Choi W.K., Ng V., Ng S.P., and Thio H.H. J. Appl. Phys. 86 3 (1999) 1398
18. Mooradian A., and Wright G.B. Phys. Rev. Lett. 16 (1966) 999
19. Mooradian A., and McWhorter A.L. Phys. Rev. Lett. 19 (1967) 849
20. Satoh M., and Kuriyama K. Phys. Rev. B 40 (1989) 3473
21. Kuriyama K., Yokoyama K., and Taniguchi T. Phys. Rev. B 45 (1992) 6251
22. Van Grieken R.E., and Markowicz A.A. Handbook of X-Ray Spectrometry (2002), Marcel Dekker
23. Dutta A.K. Appl. Phys. Lett. 68 9 (1996) 1189
24. Xu N., Xu Y., Li L., Shen Y., Zhang T., Wu J., Sun J., and Ying Z. J. Vac. Sci. Technol. A 24 3 (2006) 517