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Volumn , Issue , 2006, Pages

An 8.4ns column-access 1.3Gb/s/pin DDR3 SDRAM with an 8:4 multiplexed data-transfer scheme

Author keywords

[No Author keywords available]

Indexed keywords

ACCESS CONTROL; CMOS INTEGRATED CIRCUITS; DATA TRANSFER;

EID: 33846231586     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (3)
  • 1
    • 33645683157 scopus 로고    scopus 로고
    • A 512Mbit, 1.6Gbps/pin DDR3 SDRAM Prototype with Cio Minimization and Self-Calibration Techniques
    • June
    • C. Park, et al., "A 512Mbit, 1.6Gbps/pin DDR3 SDRAM Prototype with Cio Minimization and Self-Calibration Techniques," Dig. Symp. VLSI Circuits, pp. 370-373, June, 2005.
    • (2005) Dig. Symp. VLSI Circuits , pp. 370-373
    • Park, C.1
  • 2
    • 20844445960 scopus 로고    scopus 로고
    • 1.8-V 800-Mb/s/pin DDR2 and 2.5-V 400-Mb/s/pin DDR1 Compatibly Designed 1-Gb SDRAM
    • Apr
    • H. Fujisawa, et al., "1.8-V 800-Mb/s/pin DDR2 and 2.5-V 400-Mb/s/pin DDR1 Compatibly Designed 1-Gb SDRAM," IEEE J. Solid-State Circuits, vol. 40, pp. 862-869, Apr., 2005.
    • (2005) IEEE J. Solid-State Circuits , vol.40 , pp. 862-869
    • Fujisawa, H.1
  • 3
    • 0842331355 scopus 로고    scopus 로고
    • A Novel W/WNx/Dual-gate CMOS Technology for High-speed DRAM Having Enhanced Retention Time and Reliability
    • Dec
    • K. Saino, et al., "A Novel W/WNx/Dual-gate CMOS Technology for High-speed DRAM Having Enhanced Retention Time and Reliability," IEDM Dig. Tech. Papers, pp. 415-418, Dec., 2003.
    • (2003) IEDM Dig. Tech. Papers , pp. 415-418
    • Saino, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.