TOF mobility measurements in pristine films of P3HT: Control of hole injection and influence of film thickness

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6334, Issue , 2006, Pages

  Ballantyne, Amy M ^a   Wilson, Joanne S ^a   Nelson, Jenny ^a   Bradley, Donal D C ^a   Durrant, James R ^a   Heeney, Martin ^b   Duffy, Warren ^b   McCulloch, Iain ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b Merck Chemicals   (United Kingdom)

Author keywords

Charge mobility; Poly(3 hexylthiophene); Time of flight

Indexed keywords

ELECTRIC CURRENTS; INDIUM COMPOUNDS; MEASUREMENT THEORY; PHOTOCURRENTS; TRANSPORT PROPERTIES;

CHARGE MOBILITY; INDIUM TIN OXIDE (ITO); POLY HEXYLTHIOPHENE; TIME-OF-FLIGHT (TOF) PHOTOCURRENT MEASUREMENTS;

PLASTIC FILMS;

EID: 33846207921     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.680655     Document Type: Conference Paper

References (22)

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