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Volumn 45, Issue , 2005, Pages 339-350

Atomic-scale properties of high-k dielectrics: Ab initio study for Pr-based materials

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[No Author keywords available]

Indexed keywords


EID: 33846207046     PISSN: 14384329     EISSN: None     Source Type: Book Series    
DOI: 10.1007/11423256_27     Document Type: Article
Times cited : (1)

References (13)
  • 8
    • 0035391117 scopus 로고    scopus 로고
    • J. Da̧browski, V. Zavodinsky, and A. Fleszar, Microel. Reliability 41, 1093 (2001).
    • J. Da̧browski, V. Zavodinsky, and A. Fleszar, Microel. Reliability 41, 1093 (2001).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.