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Volumn 45, Issue , 2005, Pages 339-350
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Atomic-scale properties of high-k dielectrics: Ab initio study for Pr-based materials
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33846207046
PISSN: 14384329
EISSN: None
Source Type: Book Series
DOI: 10.1007/11423256_27 Document Type: Article |
Times cited : (1)
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References (13)
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