Effect of metal electrodes on rubrene single-crystal transistors

Applied Physics Letters

Volumn 90, Issue 1, 2007, Pages

  Takenobu, Taishi ^a,b   Takahashi, Tetsuo ^a,b   Takeya, Jun ^c   Iwasa, Yoshihiro ^a,b  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; FERMI LEVEL; OLEFINS; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; TRANSISTORS;

METAL WORK FUNCTIONS; SINGLE-CRYSTAL TRANSISTORS;

ELECTRODES;

EID: 33846102554     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2408642     Document Type: Article

References (18)

1. R. W. I. de Boer, M. E. Gershenson, A. F. Morpurgo, and V. Podzorov, Phys. Status Solidi A 201, 1302 (2004).
2. V. Podzorov, E. Menard, A. Borissov, V. Kiryukhin, J. A. Rogers, and M. E. Gershenson, Phys. Rev. Lett. 93, 086602 (2004).
3. J. Takeya, K. Tsukagoshi, Y. Aoyagi, T. Takenobu, and Y. Iwasa, Jpn. J. Appl. Phys., Part 2 44, L1393 (2005).
4. V. Podzorov, E. Menard, J. A. Rogers, and M. E. Gershenson, Phys. Rev. Lett. 95, 226601 (2005).
5. M. Pope and C. E. Swenberg, Electronic Processes in Organic Crystals and Polymers, 2nd ed. (Oxford University Press, London, 1999), Chap., p. 192.
6. T. Takahashi, T. Takenobu, J. Takeya, and Y. Iwasa, Appl. Phys. Lett. 88, 033505 (2006).
7. J. Takeya, C. Goldmann, S. Haas, K. P. Pernstich, B. Ketterer, and B. Batlogg, J. Appl. Phys. 94, 5800 (2003).
8. J. Takeya, T. Nishikawa, T. Takenobu, S. Kobayashi, Y. Iwasa, T. Mitani, C. Goldmann, C. Krellner, and B. Batlogg, Appl. Phys. Lett. 85, 5078 (2004).
9. R. W. I. de Boer and A. F. Morpurgo, Phys. Rev. B 72, 073207 (2005).
10. T. B. Singh, F. Meghdadi, S. Günes, N. Marjanovic, G. Horowitz, P. Lang, S. Bauer, and N. S. Sariciftci, Adv. Mater. (Weinheim, Ger.) 17, 2315 (2005).
11. T. Yasuda, T. Goto, K. Fujita, and T. Tsutsui, Appl. Phys. Lett. 85, 2098 (2004).
12. R. W. I. de Boer, A. F. Stassen, M. F. Craciun, C. L. Mulder, A. Molinari, S. Rogge, and A. F. Morpurgo, Appl. Phys. Lett. 86, 262109 (2005).
13. E. Kuwahara, H. Kusai, T. Nagano, T. Takayanagi, and Y. Kubozono, Chem. Phys. Lett. 413, 379 (2005).
14. T. Nishikawa, S. Kobayashi, T. Nakanowatari, T. Mitani, T. Shimoda, Y. Kubozono, G. Yamamoto, H. Ishii, M. Niwano, and Y. Iwasa, J. Appl. Phys. 97, 104509 (2005).
15. Y. Takahashi, T. Hasegawa, Y. Abe, Y. Tokura, and G. Saito, Appl. Phys. Lett. 88, 073504 (2006).
16. J. Zaumseil, R. H. Friend, and H. Sirringhaus, Nat. Mater. 5, 69 (2006).
17. J. S. Swensen, C. Soci, and A. J. Heeger, Appl. Phys. Lett. 87, 253511 (2005).
18. T. Sakanoue, E. Fujiwara, R. Yamada, and H. Tada, Chem. Lett. 34, 494 (2005).