Contactless technique to quantify the edge-junction recombination in solar cells

Applied Physics Letters

Volumn 89, Issue 26, 2006, Pages

  Chen, Florence W ^a   Cotter, Jeffrey E ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC SPACE CHARGE; ETCHING; LASER APPLICATIONS; PASSIVATION; SEMICONDUCTOR JUNCTIONS;

EDGE PASSIVATION TECHNIQUES; LASER-CUT EDGES; P-N -JUNCTION SILICON DEVICES;

SOLAR CELLS;

EID: 33846089958     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2424676     Document Type: Article

References (11)

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