Control of liquid crystal alignment by deposition of silicon oxide thin film

Thin Solid Films

Volumn 515, Issue 5, 2007, Pages 3102-3106

  Son, Phil Kook ^a   Park, Jeung Hun ^a   Kim, Jae Chang ^a   Yoon, Tae Hoon ^a  

^a Pusan National University   (South Korea)

Author keywords

Amorphous thin films; Liquid crystal alignment; Photoelectron spectroscopy; Surface roughness; X ray diffraction

Indexed keywords

AMORPHOUS FILMS; PHOTOEMISSION; SILICON COMPOUNDS; STOICHIOMETRY; SURFACE ROUGHNESS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS THIN FILMS; LIQUID CRYSTAL ALIGNMENT; X-RAY PHOTOEMISSION SPECTROSCOPY;

LIQUID CRYSTALS;

EID: 33845951443     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.09.002     Document Type: Article

References (13)

1. Hirschman K.D., Tsybeskov L., Duttagupta S.P., and Fauchet P.M. Nature 384 (1996) 338
2. Himpsel F.J., McFeely F.R., Taleb-Ibrahimi A., Yarmoff J.A., and Hollinger G. Phys. Rev., B 38 (1988) 6084
3. Pasquarello A., Hybertsen M.S., and Car R. Phys. Rev. Lett. 74 (1995) 1024
4. Yi C., Kim H.U., Rhee S.W., Oh S.H., and Park C.-G. J. Vac. Sci. Technol., B 19 (2001) 2067
5. Grunthaner F.J., and Grunthaner P.J. Mater. Sci. Rep. 1 (1986) 65
6. Ohgawara M., Uchida T., and Shibata Y. Mol. Cryst. Liq. Cryst. 98 (1983) 149
7. Son P.K., Park J.H., Cha S.S., Kim J.C., Yoon T.-H., Rho S.J., Jeon B.K., Kim J.S., Lim S.K., and Kim K.H. Appl. Phys. Lett. 88 (2006) 263512
8. Christie A.B. In: Walls J.M. (Ed). X-ray Photoelectron Spectroscopy in Methods of Surface Analysis (1987), Cambridge University Press, New York 157
9. Watts J.F., and Wolstenholme J. An Introduction to Surface Analysis by XPS and AES (2003), John Wiley and Sons Ltd., Chichester 76
10. Antony A., Nisha M., Manoj R., and Jayaraj M.K. Appl. Surf. Sci. 225 (2004) 294
11. Rinnert H., Vergnat M., Marchal G., and Burneau A. J. Lumin. 80 (1999) 445
12. Miyazaki H., and Goto T. J. Non-Cryst. Solids 352 (2006) 329
13. Rinnert H., Vergnat M., and Marchal G. Mater. Sci. Eng., B 69/70 (2000) 484