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Volumn 570, Issue 2 SPEC. ISS., 2007, Pages 230-235
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Functional testing of the ATLAS SCT barrels
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Author keywords
ATLAS; Barrel macro assembly; Functional test; Microstrip; SCT; Silicon
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Indexed keywords
MICROSTRIP DEVICES;
MOUNTINGS;
PARTICLE BEAM TRACKING;
SILICON;
STRUCTURAL DESIGN;
BARREL MACROASSEMBLY;
FUNCTIONAL TEST;
READOUT CHAIN;
SEMICONDUCTOR TRACKER;
SEMICONDUCTOR DEVICES;
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EID: 33845930394
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.09.051 Document Type: Article |
Times cited : (8)
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References (14)
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