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Volumn 457, Issue 1-2, 2001, Pages 369-377

Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS SemiConductor Tracker

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; COLLIDING BEAM ACCELERATORS; DATA COMMUNICATION SYSTEMS; OPTICAL LINKS; RADIATION EFFECTS; RADIATION HARDENING; SEMICONDUCTOR DEVICES;

EID: 0035152085     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00763-4     Document Type: Article
Times cited : (29)

References (20)
  • 6
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    • Radiation tests of optical link components for the ATLAS SCT
    • Rome 21-25 September CERN/LHCC/98-36
    • D.G. Charlton et al., Radiation tests of optical link components for the ATLAS SCT, Proceedings of the Fourth Workshop on Electronics for the LHC, Rome 21-25 September 1998, CERN/LHCC/98-36.
    • (1998) Proceedings of the Fourth Workshop on Electronics for the LHC
    • Charlton, D.G.1
  • 8
    • 0343546823 scopus 로고    scopus 로고
    • Radiation damage due to NIEL in GaAs particle detectors
    • June
    • A. Chillingarov et al., Radiation damage due to NIEL in GaAs particle detectors, ATLAS Internal Note INDET-NO-134, June 1996.
    • (1996) ATLAS Internal Note INDET-NO-134
    • Chillingarov, A.1
  • 16
    • 85031523213 scopus 로고    scopus 로고
    • AMS report available on www at url
    • AMS report available on www at url: www.ams.int/quality/.
  • 17
    • 85031529273 scopus 로고    scopus 로고
    • Measurement of dose rate dependence of radiation induced damage to the current gain in bipolar transistor
    • November 8-14 Toronto. Preprint SCIPP 98/02 available on www at url
    • D. Dorfan et al., Measurement of dose rate dependence of radiation induced damage to the current gain in bipolar transistor, Presented at the IEE Nuclear Science Symposium, November 8-14 1998, Toronto. Preprint SCIPP 98/02 available on www at url: http://scipp.ucsc.edu/~hartmut/IEEE_98/N17-3-record.ps.
    • (1998) Presented at the IEE Nuclear Science Symposium
    • Dorfan, D.1
  • 19
    • 0019208250 scopus 로고
    • Microelectronic
    • Blanks H.S. Microelectronic. Reliability. 20:1980;297.
    • (1980) Reliability , vol.20 , pp. 297
    • Blanks, H.S.1
  • 20
    • 85031531443 scopus 로고    scopus 로고
    • MIL-STD-883B. Avaialable on www at url
    • MIL-STD-883B. Avaialable on www at url: http://www.dscc.dla.mil/programs/milspec/ListDocs.asp?BasicDoc=MIL-STD-883.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.