Radiation hardness and lifetime studies of photodiodes for the optical readout of the ATLAS semiconductor tracker

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 456, Issue 3, 2001, Pages 300-309

  Charlton, D G ^a   Dowell, J D ^a   Homer, R J ^a   Jovanovic, P ^a   Kenyon, I R ^a   Mahout, G ^a   Shaylor, H R ^a   Sibley, A ^a   Wilson, J A ^a   Bibby, J H ^b   Gregor, I M ^b   Wastie, R L ^b   Weidberg, A R ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HARDNESS; NEUTRON IRRADIATION; PARTICLE DETECTORS; PHOTOCURRENTS; PROTON IRRADIATION; RADIATION EFFECTS; READOUT SYSTEMS;

SEMICONDUCTOR TRACKERS;

PHOTODIODES;

EID: 0035151109     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00666-5     Document Type: Article

References (14)

1. Charlton D.G.et al. Nucl. Instr. and Meth. A. 443:2000;430.
2. ATLAS Inner Detector Technical Design Reports, CERN / LHCC / 97-16 / 17, April 1997.
3. G. Battistoni, A. Ferrari, P.R. Sala, Background calculations for the ATLAS detector and hall, ATLAS Internal Note, ATL-GEN-94-010, October 1994.
4. Dowell J.D.et al. Nucl. Instr. and Meth. A 424:1999;483.
5. Luera T.F.et al. IEEE Trans. Nucl. Sci. NS-34:1987;1557.
6. A. van Ginneken, Non-ionizing energy deposition in silicon for radiation damage studies, Fermilab Report FN-522, 1989.
7. Ougouag A.M. IEEE Trans. Nucl. Sci. NS-37:1990;2219.
8. Huhtinen M., Aarnio P.A. Nucl. Instr. and Meth. A 335:1993;580.
9. Pitzl D.et al. Nucl. Instr. and Meth. A 311:1992;98.
10. Beringer J.et al. Nucl. Instr. and Meth. A. 435:1999;375.
11. M. Edwards, D.R. Perry, The ISIS radiation hardness test facility, RAL-90-065, August 1990.
12. RD48 Collaboration: Status Report, CERN / LHCC / 98-39, 1998.
13. Ohring M. Reliability and Failure of Electronic Materials and Devices. 1998;Academic Press, New York.
14. Weiss E.A.et al. IEEE Trans. Reliab. 37:1988;14.