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Volumn 2, Issue , 2004, Pages 1192-1195
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Calibrating the ATLAS semiconductor tracker front end electronics
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
BENCHMARKING;
CALIBRATION;
DATA ACQUISITION;
MAGNETIC FIELDS;
POWER ELECTRONICS;
READOUT SYSTEMS;
SEMICONDUCTOR MATERIALS;
SOLENOIDS;
THRESHOLD ELEMENTS;
FRONT END ELECTRONICS;
LUMINOSITY;
SEMICONDUCTOR TRACKER (SCT);
SILICON DETECTORS;
PARTICLE BEAM TRACKING;
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EID: 23844452418
PISSN: 10957863
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (6)
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