Path-based statistical timing analysis handling arbitrary delay correlations: Theory and implementation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 25, Issue 12, 2006, Pages 2976-2988

  Wang, Wei Shen ^a,b   Orshansky, Michael ^a,b  

^a IEEE   (United States)

^b The University of Texas at Austin   (United States)

Author keywords

Integrated circuit reliability; Statistical timing analysis; Variability

Indexed keywords

CUMULATIVE DISTRIBUTION FUNCTIONS; DELAY CORRELATIONS; STATISTICAL TIMING ANALYSIS; TRUE CUMULATIVE DISTRIBUTION;

COMPUTATIONAL METHODS; DELAY CIRCUITS; ERROR ANALYSIS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; TIME SERIES ANALYSIS;

ALGORITHMS;

EID: 33845661560     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2006.882585     Document Type: Article

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