Development of the scanning atom probe

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 562-563

  Cerezo, A ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042923088     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603442815     Document Type: Conference Paper

References (8)

1. O. Nishikawa and M. Kimoto, Appl. Surf. Sci. 76/77(1994) 424.
2. T.F. Kelly et al., Ultramicroscopy 62 (1995) 29.
3. J. A. Liddle et al., J. Phys. (Paris) Colloq. 49-C6 (1988) 509.
4. D. J. Larson et al., Appl. Surf Sci. 87/88 (1995) 446.
5. D. J. Larson et al., J. Appl. Phys. 87 (2000), 5989.
6. O. Nishikawa et al., J. Vac. Sci. Technol. B 18 (2000) 653.
7. M. Huang et al., Ultramicroscopy 89 (2001) 163.
8. A. Cerezo et al., Rev. Sci. Instrum. 71 (2000) 3016.