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Volumn 601, Issue 1, 2007, Pages 24-29

Si(1 1 1)-H(1 × 1): A mirror for atoms characterized by AFM, STM, He and H2 diffraction

Author keywords

Atom solid interactions; Atom solid interactions, scattering, diffraction; Atomic force microscopy; Scanning tunneling microscopy; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; HELIUM; HYDROGEN; LIGHT SCATTERING; MIRRORS; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON;

EID: 33845641028     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.08.048     Document Type: Article
Times cited : (18)

References (21)
  • 20
    • 0003158036 scopus 로고
    • Scoles G. (Ed), Oxford University Press
    • Miller D.R. In: Scoles G. (Ed). Atomic and Molecular Beam Methods Vol. I (1988), Oxford University Press 14-53
    • (1988) Atomic and Molecular Beam Methods , vol.I , pp. 14-53
    • Miller, D.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.