Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica

Journal of Colloid and Interface Science

Volumn 306, Issue 2, 2007, Pages 459-463

  Briscoe, Wuge H ^a   Chen, Meng ^a   Dunlop, Iain E ^a   Klein, Jacob ^a   Penfold, Jeffrey ^b   Jacobs, Robert M J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Mica; Nanofilms; Surface characterisation; Surface grown polymer brushes; Thin films; X ray reflectometry; XRR

Indexed keywords

ALGORITHMS; MICA; MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; REFLECTOMETERS; X RAY ANALYSIS;

SURFACE CHARACTERIZATION; SURFACE-GROWN POLYMER BRUSHES; X-RAY REFLECTOMETRY;

THIN FILMS;

AMPHOLYTE; CHROMIUM; DIPALMITOYLPHOSPHATIDYLCHOLINE; GOLD; METHACRYLIC ACID DERIVATIVE; MICA; NANOFILM; PHOSPHORYLCHOLINE; POLY(2 METHACRYLOYLOXYETHYLPHOSPHORYLCHOLINE); POLYMER;

AIR; ALGORITHM; ARTICLE; BENDING MICA; BIREFRINGENCE; CURVE FITTING; LANGMUIR BLODGETT FILM; PARRAT ALGORITHM; PHOSPHOLIPID MEMBRANE; PRIORITY JOURNAL; REFLECTOMETRY; RIGIDITY; SURFACE GROWN POLYMER BRUSH; SURFACE PROPERTY; TECHNIQUE; THICKNESS; X RAY REFLECTOMETRY;

EID: 33845605126     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2006.10.031     Document Type: Article

References (26)

1. Israelachvili J.N., and Adams G.E. Nature 262 (1976) 774
2. Klein J. Nature 288 (1980) 248
3. Briscoe W.H., Titmuss S., Tiberg F., Thomas R.K., McGillivary D.J., and Klein J. Nature 444 (2006) 191
4. Ducker W.A., Senden T.J., and Pashley R.M. Nature 353 (1991) 239
5. Hanson P.I., Roth R., Morisaki H., Jahn R., and Heuser J.E. Cell 90 (1997) 523
6. Richter R.P., and Brisson A.R. Biophys. J. 88 (2005) 3422
7. Lekner J. Theory of Reflection (1987), Martinus Nijhoff Publishers, Dordrecht
8. Born M., and Wolf E. Principles of Optics Electromagnetic Theory of Propagation Interference and Diffraction of Light. sixth ed. (1999), Cambridge Univ. Press, Cambridge
9. Claesson P.M., Blomberg E., Paulson O., and Malmsten M. Colloids Surf. A 112 (1996) 131
10. Parratt L.G. Phys. Rev. 95 (1954) 359
11. Schalke M., and Losche M. Adv. Colloid Interface Sci. 88 (2000) 243
12. Lee D.R., Shin K., Seeck O.H., Kim H., Seo Y.S., Tolan M., Rafailovich M.H., Sokolov J., and Sinha S.K. Phys. Rev. Lett. 90 (2003)
13. Fenter P. In: Fenter P., Rivers M., Sturchio N.C., and Sutton S. (Eds). Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science. Reviews in Mineralogy and Geochemistry vol. 49 (2002), Geochemical Society 149
14. Chew R.K., Yoon S.F., Chan H.K., Ng C.F., Zhang Q., and Ahn J. Int. J. Mod. Phys. B 16 (2002) 1072
15. Poloucek P., Pietsch U., Geue T., Symietz Ch., and Brezesinski G. J. Phys. D Appl. Phys. 34 (2001) 450
16. Politsch E., and Cevc G. J. Appl. Crystallogr. 35 (2002) 347
17. Brown A.S., Holt S.A., Saville P.M., and White J.W. Aust. J. Phys. 50 (1997) 391
18. Als-Nielsen J., and McMorrow D. Elements of Modern X-Ray Physics (2001), Wiley, West Sussex, UK
19. Tolan M. X-Ray Scattering from Soft-Matter Thin Films (1999), Springer, Heidelberg
20. Boudaoud A., Patricio P., Couder Y., and Ben Amar M. Nature 407 (2000) 718
21. Kaldor S.K., and Noyan I.C. Appl. Phys. Lett. 80 (2002) 2284
22. Chen X.Y., and Armes S.P. Adv. Mater. 15 (2003) 1558
23. M. Chen, W.H. Briscoe, S.P. Armes, H. Cohen, J. Klein, J. Am. Chem. Soc. (2006), submitted for publication
24. Pashley D.W., Stowell M.J., Jacobs M.H., and Law T.J. Philos. Mag. 10 (1964) 127
25. M. Chen, W.H. Briscoe, J. Klein, 2006, in preparation
26. Cheng L., Fenter P., Nagy K.L., Schlegel M.L., and Sturchio N.C. Phys. Rev. Lett. 8715 (2001)