X-ray reflectivity analysis of thin complex Langmuir-Blodgett films

Journal of Physics D: Applied Physics

Volumn 34, Issue 4, 2001, Pages 450-458

  Poloucek P ^a   Pietsch, U ^b   Geue, T ^b   Symietz, Ch ^c   Brezesinski, G ^c  

^a MASARYK UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF POTSDAM   (Germany)

^c MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; LIPIDS; MATHEMATICAL MODELS; PATTERN MATCHING; POLYELECTROLYTES; REFLECTION; SURFACE STRUCTURE; X RAY ANALYSIS;

CHARGE COUPLED ELECTROLYTE; MODEL FREE FITTING METHOD; THIN ORGANIC FILMS; X RAY REFLECTIVITY ANALYSIS;

LANGMUIR BLODGETT FILMS;

EID: 0342855227     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/4/302     Document Type: Article

References (19)

1. Möhwald H, Dahmen U, de Meijere K and Brezesinski G 1998 Prog. Colloid Polym. Sci. 109 3
2. Antonietti M, Conrad J and Thünemann A 1994 Macromolecules 27 6007 Rädler J O, Koltover I, Salditt T and Safinya C R 1997 Science 275 810
3. Antonietti M, Conrad J and Thünemann A 1994 Macromolecules 27 6007 Rädler J O, Koltover I, Salditt T and Safinya C R 1997 Science 275 810
4. de Meijere K, Brezesinski G and Möhwald H 1997 Macmmolecules 30 2337-42
5. Als Nielsen J and Kjaer K 1989 In Phase Transitions in Soft Condensed Matter ed T Riste and D Sherrington (New York: Plenum) p 113
6. Russell T P 1990 Mater. Sci. Rep. 5 171
7. Tolan M 1999 X ray Scattering from Soft Matter Thin Films (Springer Tracts in Modern Physics vol 148) (Berlin: Springer)
8. Seeck O H, Kaendler I D, Tolan M, Shin K, Rafailovich M H, Sokolov J and Kolb R 2000 Appl. Phys. Lett. 76 2713-15
9. Sanyal M K, Basu J K, Datta A and Banerjee S 1996 Europhys. Lett. 36 265-70
10. Pedersen J S and Hamley W I 1994 J. Appl. Cryst. 27 36-49 Berk N F and Majkrzak C F 1995 Phys. Rev. B 51 11 296-309
11. Pedersen J S and Hamley W I 1994 J. Appl. Cryst. 27 36-49 Berk N F and Majkrzak C F 1995 Phys. Rev. B 51 11 296-309
12. de Meijere K, Netz R R, Joanny J F, Donath E, Brezesinski G and Möhwald H 2000 Proc. Natl Acad. Sci. USA submitted
13. de Meijere K, Brezesinski G, Pfohl T and Möhwald H 1999 J. Phys. Chem. B 103 8888
14. Webpage http://wwwhasylab.desy.de/
15. Pietsch U, Barberka T A, Geue T and Stömmer R 1997 Nuovo Cimento D 19 393-402
16. Holý V, Pietsch U and Baumbach T 1999 High Resolution X ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics vol 149) (Berlin: Springer) part II
17. Gill P E, Murray W and Wright M H 1981 Practical Optimization (London: Academic)
18. Webpage http://www.ulib.org/webRoot/Books/Numerical_Recipes
19. Brzezinski V and Peterson I R 1995 J. Phys. Chem. 99 12 545-52