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Volumn 80, Issue 13, 2002, Pages 2284-2286
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Differentiating between elastically bent rectangular beams and plates
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Author keywords
[No Author keywords available]
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Indexed keywords
BEAMS AND PLATES;
BENT BEAMS;
CAMBRIDGE;
CAMBRIDGE UNIVERSITY;
CURVATURE MEASUREMENT;
DEGREE OF BENDING;
EXPERIMENTAL VERIFICATION;
FLEXURAL RIGIDITIES;
FOUR-POINT BENDING;
ISOTROPIC MATERIALS;
PLATE COMPONENTS;
QUANTITATIVE TECHNIQUES;
RECTANGULAR BEAMS;
SINGLE SPECIMEN;
STRESS STATE;
X RAY MICRODIFFRACTION;
ANISOTROPY;
CONSTITUTIVE EQUATIONS;
ELASTICITY;
SILICON WAFERS;
SINGLE CRYSTALS;
STRESSES;
X RAY DIFFRACTION;
PLATES (STRUCTURAL COMPONENTS);
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EID: 79956033749
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1459762 Document Type: Article |
Times cited : (32)
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References (19)
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