Measurements of the optical constants of scandium in the 50-1300eV range

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5538, Issue , 2004, Pages 64-71

  Aquila, A L ^a   Salmassi, F ^a   Gullikson, E M ^a   Eriksson, F ^b   Birch, J ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

EUV; Index of refraction; Sc; Soft x ray

Indexed keywords

EUV; INDEX OF REFRACTION; MULTILAYER REFLECTIVITY; SOFT X-RAY;

LIGHT SOURCES; MAGNETRON SPUTTERING; MULTILAYERS; REFLECTION; REFRACTIVE INDEX; THIN FILMS; X RAYS;

SCANDIUM;

EID: 15844387714     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.563615     Document Type: Conference Paper

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